Publication Date
Volume
8
Issue
1
Start Page
39
File Attachment
V-8_1.pdf11.06 MB
Abstract
This paper describes the design and development of an automated LEID, limits of error of inventory difference, computation process. The experience and procedure used in this project may be of help in solving related problems. In the Introduction, the definition of ID, inventory difference, and LEID and the reasons for computing them are introduced. The fabrication plant operations and the ID and LEID computation related activities are briefly described, for background knowledge. The analysis of LEID computations, which involves the assumption of an additive model of all the possible error sources, is described, including the application of the error propagation method of computing the variance of each error source, and the use of the analysis of variance technique to estimate random error and systematic error variances. Finally, the organization of the computations process and its input/ output files are explained.