Can Wavefront-Shaped Optical Responses be used for Tags and Seals?

Current state-of-the-art tamper indicating tags/seals for nuclear materials management typically use passive optical techniques which depend on a random distribution of particles within the tag/seal. While these technologies are functional, there are security and implementation limitations. To improve upon these techniques, we propose an active characterization technique based on wavefront-shaping controlled optical responses of nanoparticle-doped adhesive tags/seals. The use of an active characterization technique adds more flexibility and additional layers of security over current techniques.