A Multiple Technique Approach to the Chemical Analysis of Signatures for the Proliferation of Nuclear Materials

Laboratories whose mission focuses on the development of analytical protocols for the detection of materials considered to be signatures for nuclear proliferation, generally concentrate their effort on a limited number of very specific analytical techniques. This paper will present results from an investigation which has taken a multiple technique approach to the detection of signature materials. Data will be presented employing techniques such as wavelength dispersive X-ray fluorescence spectrometry (WDXRF), inductively coupled plasma - atomic emission spectroscopy (ICP-AES), inductively coupled plasma - mass spectrometry (ICP-MS), scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDS), secondary ion mass spectrometry (SIMS) and Auger electron spectroscopy (AES) for the qualitative and quantitative analysis of signatures for the proliferation of nuclear materials.